NEXT TEST SOLUTION

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ABOUT US

NTS contributes in the advancement of mankind from unseen locations.

CEO Message
It is not seen but it is the driving force for producting the best products
Vision & History
“Differentiated Technology” “Necessary Technology”and “Our Technology”
Location
Introducing NTS HQ, Incheon Plant and Hanoi Vietnam Plant

PRODUCT

Introducting the products by NTS

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2018.02.19 (16:28) SXG-15SF-3.65-W018-G3-15-K1 SXG-15SF-3.65-W018-G3-15-K1 Bat pin
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2018.02.19 (16:26) SXB-15SF-5.7-B022-G3-22-K1 Regarding the mechanical life span, it depends on customer test environment. Bat pin
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2018.02.19 (16:25) SXB-15SF-3.3-B022-G3-27-K1 Bat pin
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2018.02.19 (16:19) SG-55RT-6.7-S005-G3-28-K1 SG-55RT-6.7-S005-G3-28-K1 Double pin
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2018.02.19 (16:18) SE-55RT-5.7-S010-G3-13-K1 SE-55RT-5.7-S010-G3-13-K1 Double pin
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2018.02.19 (16:13) SB-22RT-3.3-W016-G3-31-K1 SB-22RT-3.3-W016-G3-31-K1 Double pin
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2018.02.19 (15:27) PKG -176QFN-20X20 1. PKG -176QFN-20X20 2. Pitch -0.4 3. Cover type -BCR Semiconductor test socket
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2018.02.19 (15:27) PKG -20SOP 1. PKG -20SOP 2. Pitch -1.27 3. Cover type - BC Semiconductor test socket
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2018.02.19 (15:26) PKG -176QFN-20X20 1. PKG -176QFN-20X20 2. Pitch-0.4 3. Cover type -BCR SOCKET minimizing CONTACT FAIL with DUAL PIN on each LEAD Semiconductor test socket
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2018.02.19 (15:26) MAF45-5.82X3.05-0.645-P1 MAF45-5.82X3.05-0.645-P1 Semiconductor test socket
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2018.02.19 (15:26) PKG -46QFN 1. PKG -46QFN 2. Pitch-0.4 3. Cover type - CN SOCKET minimizing CONTACT FAIL with DUAL PIN on 1PAD Semiconductor test socket
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2018.02.19 (15:25) PKG -48QFN 1. PKG -48QFN 2. Pitch -0.35 3. Cover type - BCR Semiconductor test socket
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2018.02.19 (15:25) PKG -20QFN-3X3 1. PKG -20QFN-3X3 2. Pitch-0.4 3. Cover type - CS SOCKET minimizing CONTACT FAIL with minimum QFN TYPE SIZE DUAL PIN on 1PAD Semiconductor test socket
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2018.02.19 (15:24) PKG -48QFN 1. PKG -48QFN 2. Pitch-0.4 3. Cover type - BCR SOCKET minimizing CONTACT FAIL with DUAL PIN on 1PAD Semiconductor test socket
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2018.02.19 (15:24) PKG -6QFN 1. PKG -6QFN 2. Pitch -1.05 3. Cover type - BCR SOCKET minimizing CONTACT FAIL with DUAL PIN on 1PAD Semiconductor test socket
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2018.02.19 (15:23) PKG -1069BGA/556LPDDR4 1. PKG -1069BGA/556LPDDR4 2. Pitch - 0.35 SLT Vacuum TYPE Vacuum on SOCKET area through SLT process allows simultaneous, direct device PUSH and TEST 10Ghz operating frequency Semiconductor test socket
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2018.02.19 (15:23) PKG -1069BGA/556LPDDR4 1. PKG -1069BGA/556LPDDR4 2. Pitch - 0.35 3. Cover type - BCR 4. Shared POP SOCKET for SLT/MANUAL Shared SLT usage enabled by separating TOP SOCKET in MANUAL 10Ghz operating frequency Semiconductor test socket
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2018.02.19 (15:23) PKG -905FBGA 1. PKG -905FBGA 2. Pitch -0.65 3. Cover type - BCR 4. SOCKET capable of device thermal emission through FAN/heat sink 2.5Ghz operating frequency Semiconductor test socket
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2018.02.19 (15:22) PKG -200B / 350B / 556B / 716B .... PKG -200B / 350B / 556B / 716B .... Semiconductor test socket
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2018.02.19 (15:22) PKG -200B / 350B / 556B / 716B .... 1. PKG -200B / 350B / 556B / 716B .... 2. Pitch -0.35 3. Cover type - CSR 4. 60~80℃ and 20~40℃ test socket Push block height fine adjustment cover type Cover handle operation range 0°~180° (open/close) Fine adjustment by 0.05mm For each thickness of identical PKG EX) 556B - T = 0.8mm / T = 0.85mm / T = 0.9mm .... Semiconductor test socket

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